Notes on “Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs”

June 30, 2009

Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs: Ma, Y. and Shi, W.

I thought, based on the title, that this paper would give some indication of a debugging experience on a VLSI Device Test Program (which seemed like a likely candidate for  DSL). It didn’t.
Advertisements
%d bloggers like this: